Requisites for ultimate energy resolution EELS and band gap measurements in TEM

Essers, E.; Höschen, R.; Matijevic, M.; Benner, G.; Koch, C. T.

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Requisites for ultimate energy resolution EELS and band gap measurements in TEM

Essers, E., Höschen, R., Matijevic, M., Benner, G., & Koch, C. T. (2006). Requisites for ultimate energy resolution EELS and band gap measurements in TEM. In Proceedings of the 16th International Microscopy Congress 2006 (pp. 810-810). International Federation of Societies in Microscopy.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-47DB-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-47DC-E

Genre: Conference Paper

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Creators:
Essers, E.¹, Author
Höschen, R.^{2, 3}, Author
Matijevic, M.¹, Author
Benner, G.¹, Author
Koch, C. T.^{2, 3}, Author

Affiliations:
1Carl Zeiss GmbH, Carl-Zeiss-Str. 56, 73447 Oberkochen, Germany, ou_persistent22
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669

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Free keywords: MPI für Intelligente Systeme; Stuttgart Center for Electron Microscopy (StEM);

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Language(s): eng - English

Dates: Date issued: 2006

Publication Status: Issued

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Identifiers: eDoc: 287718

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Title: 16th International Microscopy Congress - IMC16

Place of Event: Sapporo, Japan

Start-/End Date: 2006-09-03 - 2006-09-08

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Title: Proceedings of the 16th International Microscopy Congress 2006

Source Genre: Proceedings

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Publ. Info: International Federation of Societies in Microscopy

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 810 - 810 Identifier: -