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  Interdiffusion in microstructurally different Si/Al multilayered structures.

Wang, J. Y., He, D., Zalar, A., & Mittemeijer, E. J. (2006). Interdiffusion in microstructurally different Si/Al multilayered structures. Surface and Interface Analysis, 38, 773-776.

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 Creators:
Wang, J. Y.1, Author           
He, D.1, Author           
Zalar, A., Author
Mittemeijer, E. J.1, 2, Author           
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;
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Language(s): eng - English
 Dates: 2006
 Publication Status: Issued
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 Rev. Type: Peer
 Identifiers: eDoc: 285327
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Title: Surface and Interface Analysis
Source Genre: Journal
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Pages: - Volume / Issue: 38 Sequence Number: - Start / End Page: 773 - 776 Identifier: -