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  Projected potential profiles across interfaces obtained by reconstructing the exit face wave function from through focal series

Bhattacharyya, S., Koch, C. T., & Rühle, M. (2006). Projected potential profiles across interfaces obtained by reconstructing the exit face wave function from through focal series. Ultramicroscopy, 106, 525-538.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4706-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4707-E
Genre: Journal Article

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 Creators:
Bhattacharyya, S., Author           
Koch, C. T.1, Author           
Rühle, M.2, Author           
Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
2Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497650              

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM); Emeriti and Others;
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Language(s): eng - English
 Dates: 2006
 Publication Status: Issued
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 Rev. Type: Peer
 Identifiers: eDoc: 284890
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Title: Ultramicroscopy
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 106 Sequence Number: - Start / End Page: 525 - 538 Identifier: -