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  Measuring electrostatic potential profiles across amorphous intergranular films by electron diffraction

Koch, C. T., Bhattacharyya, S., Rühle, M., Satet, R., & Hoffmann, M. J. (2006). Measuring electrostatic potential profiles across amorphous intergranular films by electron diffraction. Microscopy and Microanalysis, 12, 160-169.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-46B5-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-46B6-A
Genre: Journal Article

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 Creators:
Koch, C. T.1, Author           
Bhattacharyya, S., Author           
Rühle, M.2, Author           
Satet, R.3, Author
Hoffmann, M. J.3, Author
Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
2Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497650              
3Institut für Keramik im Maschinenbau, UniversitätKarlsruhe (TH), D-76131 Karlsruhe, Germany, ou_persistent22              

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM); Emeriti and Others;
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Language(s): eng - English
 Dates: 2006
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 282009
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Title: Microscopy and Microanalysis
Source Genre: Journal
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Pages: - Volume / Issue: 12 Sequence Number: - Start / End Page: 160 - 169 Identifier: -