XRD and TEM study of NiO-LSGM reactivity

Manga, V. R.; Sturm, S.; Phillipp, F.; Zinkevich, M.

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XRD and TEM study of NiO-LSGM reactivity

Manga, V. R., Sturm, S., Phillipp, F., & Zinkevich, M. (2006). XRD and TEM study of NiO-LSGM reactivity. International Journal of Materials Research, 97, 789-793.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-46AD-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-46AE-D

Genre: Journal Article

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Creators:
Manga, V. R.¹, Author
Sturm, S.², Author
Phillipp, F.³, Author
Zinkevich, M.¹, Author

Affiliations:
1Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497654
2Former DeparFormer Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497655
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497669

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM); Abt. Aldinger;

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Language(s): eng - English

Dates: Date issued: 2006

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 282003

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Title: International Journal of Materials Research

Source Genre: Journal

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Pages: - Volume / Issue: 97 Sequence Number: - Start / End Page: 789 - 793 Identifier: -