Lattice distortion analysis and its application to semiconductor quantum dot 
structures

Jin-Phillipp, N.-Y.

Local TagsRelease HistoryDetailsSummary

Lattice distortion analysis and its application to semiconductor quantum dot structures

Jin-Phillipp, N.-Y. (2006). Lattice distortion analysis and its application to semiconductor quantum dot structures. Journal of Chinese Electron Microscopy Society, 25(3), 190-199.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-45FE-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-45FF-0

Genre: Journal Article

Files

show Files

Locators

show

Creators

show

hide

Creators:
Jin-Phillipp, N.-Y.^{1, 2, 3}, Author

Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
2Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669

Content

show

hide

Free keywords: MPI für Metallforschung; Abt. Dosch;

Abstract: -

Details

show

hide

Language(s): eng - English

Dates: Date issued: 2006-03-25

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: Peer

Identifiers: eDoc: 298466

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Journal of Chinese Electron Microscopy Society

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: -

Pages: - Volume / Issue: 25 (3) Sequence Number: - Start / End Page: 190 - 199 Identifier: -