X-ray diffraction and STM study of reactive surfaces under electrochemical 
control: Cl and I on Cu(100)

Huemann, S.; Hai, T. M.; Broekmann, P.; Wandelt, K.; Zajonz, H.; Dosch, H.; Renner, F.

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X-ray diffraction and STM study of reactive surfaces under electrochemical control: Cl and I on Cu(100)

Huemann, S., Hai, T. M., Broekmann, P., Wandelt, K., Zajonz, H., Dosch, H., et al. (2006). X-ray diffraction and STM study of reactive surfaces under electrochemical control: Cl and I on Cu(100). Journal of Physical Chemistry B, 110, 24955-24963.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-455D-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-455E-B

Genre: Journal Article

Alternative Title : J. Phys. Chem. B

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Creators:
Huemann, S.¹, Author
Hai, T. M.¹, Author
Broekmann, P.¹, Author
Wandelt, K.¹, Author
Zajonz, H.², Author
Dosch, H.^{2, 3}, Author
Renner, F.², Author

Affiliations:
1Institut für Physikalische und Theoretische Chemie, Universität Bonn, Wegelerstr. 12, 53115 Bonn, Germany; Institut für Chemische und Angewandte Physik, Universität Stuttgart, Pfaffenwaldring 57/VI, 70569 Stuttgart, Germany; European Synchrotron Radiation Facility, BP 220, 38043 Grenoble Cedex, France, ou_persistent22
2Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645
3Universität Stuttgart, Institut für Theoretische und Angewandte Physik, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Dosch;

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Language(s): eng - English

Dates: Date issued: 2006-09-22

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 305022

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Title: Journal of Physical Chemistry B

Alternative Title : J. Phys. Chem. B

Source Genre: Journal

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Pages: - Volume / Issue: 110 Sequence Number: - Start / End Page: 24955 - 24963 Identifier: -