SESAM: Exploring the frontiers of electron microscopy

Koch, C. T.; Sigle, W.; Höschen, R.; Rühle, M.; Essers, E.; Benner, G.; Matijevic, M.

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SESAM: Exploring the frontiers of electron microscopy

Koch, C. T., Sigle, W., Höschen, R., Rühle, M., Essers, E., Benner, G., et al. (2006). SESAM: Exploring the frontiers of electron microscopy. Microscopy and Microanalysis, 12(6), 506-514.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4511-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4512-2

Genre: Journal Article

Alternative Title : Microsc. Microanal.

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Creators:
Koch, C. T.¹, Author
Sigle, W.¹, Author
Höschen, R.¹, Author
Rühle, M.², Author
Essers, E.³, Author
Benner, G.³, Author
Matijevic, M.³, Author

Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669
2Emeriti, MPI for Nuclear Physics, Max Planck Society, Saupfercheckweg 1, 69117 Heidelberg, DE, ou_904551
3Carl Zeiss SMT NTS Div, D-73447 Oberkochen, Germany., ou_persistent22

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Free keywords: MPI für Metallforschung; Zentrum für Transmissionslektronenmikroskopie; Emeriti and Others;

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Language(s): eng - English

Dates: Date issued: 2006-12

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 297854
ISI: 000242478200010

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Title: Microscopy and Microanalysis

Alternative Title : Microsc. Microanal.

Source Genre: Journal

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Pages: - Volume / Issue: 12 (6) Sequence Number: - Start / End Page: 506 - 514 Identifier: ISSN: 1431-9276