Diffusion reactions at Al-MgAl2O4 interfaces - and the effect of applied 
electric fields

Yu, Y.; Mark, J.; Ernst, F.; Wagner, T.; Raj, R.

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Diffusion reactions at Al-MgAl₂O₄ interfaces - and the effect of applied electric fields

Yu, Y., Mark, J., Ernst, F., Wagner, T., & Raj, R. (2006). Diffusion reactions at Al-MgAl₂O₄ interfaces - and the effect of applied electric fields. Journal of Materials Science, 41(23), 7785-7797.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4505-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4506-D

Genre: Journal Article

Alternative Title : J. Mater. Sci.

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Creators:
Yu, Y.¹, Author
Mark, J.¹, Author
Ernst, F.², Author
Wagner, T.³, Author
Raj, R.¹, Author

Affiliations:
1Case Western Reserve Univ, Dept Mat Sci & Engn, Cleveland, OH 44106 USA, ou_persistent22
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
3Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640

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Free keywords: MPI für Metallforschung; Abt. Arzt; ZWE Dünnschichtlabor;

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Language(s): eng - English

Dates: Date issued: 2006-12

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 297755
ISI: 000242825100016

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Title: Journal of Materials Science

Alternative Title : J. Mater. Sci.

Source Genre: Journal

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Pages: - Volume / Issue: 41 (23) Sequence Number: - Start / End Page: 7785 - 7797 Identifier: ISSN: 0022-2461