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  Analytical performance of the SESAM microscope

Essers, E., Matijevic, M., Benner, G., Höschen, R., Sigle, W., & Koch, C. (2007). Analytical performance of the SESAM microscope. Microscopy & Microanalysis, 13(Suppl. 3), 18-19.

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 Creators:
Essers, E.1, Author
Matijevic, M.1, Author
Benner, G.1, Author
Höschen, R.2, 3, Author           
Sigle, W.2, 3, Author           
Koch, C.2, 3, Author           
Affiliations:
1Carl Zeiss NTS GmbH, Oberkochen, Germany, ou_persistent22              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM);
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Language(s): eng - English
 Dates: 2007
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 320730
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Title: 33rd Microscopy Conference MC 2007 - DGE Tagung (Deutsche Gesellschaft für Elektronenmikroskopie e.V.)
Place of Event: Saarbrücken
Start-/End Date: 2007-09-02 - 2007-09-07

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Title: Microscopy & Microanalysis
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 13 (Suppl. 3) Sequence Number: - Start / End Page: 18 - 19 Identifier: -