Low-loss EELS with monochromated electrons

Sigle, W.; Gu, L.; Srot, V.; Koch, C.; van Aken, P. A.

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Low-loss EELS with monochromated electrons

Sigle, W., Gu, L., Srot, V., Koch, C., & van Aken, P. A. (2007). Low-loss EELS with monochromated electrons. Microscopy & Microanalysis, 13(Suppl. 3), 54-55.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-443C-E Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-443D-C

Genre: Conference Paper

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Creators:
Sigle, W.^{1, 2}, Author
Gu, L.², Author
Srot, V.^{1, 2}, Author
Koch, C.^{1, 2}, Author
van Aken, P. A.², Author

Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM);

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Language(s): eng - English

Dates: Date issued: 2007

Publication Status: Issued

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Rev. Type: Internal

Identifiers: eDoc: 320724

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Title: 33rd Microscopy Conference MC 2007 - DGE Tagung (Deutsche Gesellschaft für Elektronenmikroskopie e.V.)

Place of Event: Saarbrücken

Start-/End Date: 2007-09-02 - 2007-09-07

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Title: Microscopy & Microanalysis

Source Genre: Journal

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Pages: - Volume / Issue: 13 (Suppl. 3) Sequence Number: - Start / End Page: 54 - 55 Identifier: -