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  EELS investigations of reference niobium oxides and anodically grown niobium oxide layers

Bach, D., Störmer, H., Schneider, R., Gerthsen, D., & Sigle, W. (2007). EELS investigations of reference niobium oxides and anodically grown niobium oxide layers. In M. Marko, J. Scott, E. Vicenzi, S. Dekanich, J. Frafjord, P. Kotula, et al. (Eds.), Microscopy and Microanalysis 2007 (pp. 1274CD-1275CD). New York, USA: Cambridge University Press.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-43BB-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-43BC-7
Genre: Conference Paper

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 Creators:
Bach, D.1, Author
Störmer, H.1, Author
Schneider, R.1, Author
Gerthsen, D.1, Author
Sigle, W.2, 3, Author           
Affiliations:
1Laboratorium für Elektronenmikroskopie, Universität Karlsruhe (TH), Karlsruhe, Germany, ou_persistent22              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM);
 Abstract: -

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Language(s): eng - English
 Dates: 2007
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 319198
 Degree: -

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Title: Microscopy and Microanalysis 2007
Place of Event: Fort Lauderdale, Florida, USA
Start-/End Date: 2007-08-05 - 2007-08-09

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Title: Microscopy and Microanalysis 2007
Source Genre: Proceedings
 Creator(s):
Marko, M., Editor
Scott, J.H., Editor
Vicenzi, E., Editor
Dekanich, S., Editor
Frafjord, J., Editor
Kotula, P., Editor
McKernan, S., Editor
Shields, J., Editor
Affiliations:
-
Publ. Info: New York, USA : Cambridge University Press
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 1274CD - 1275CD Identifier: -