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  The sub-electron-volt-sub-Angstrom-microscope (SESAM): Pushing the limits in monochromated and energy-filtered TEM

van Aken, P. A., Koch, C. T., Sigle, W., Höschen, R., Rühle, M., Essers, E., et al. (2007). The sub-electron-volt-sub-Angstrom-microscope (SESAM): Pushing the limits in monochromated and energy-filtered TEM. In M. Marko, J. Scott, E. Vicenzi, S. Dekanich, J. Frafjord, P. Kotula, et al. (Eds.), Microscopy and Microanalysis 2007 (pp. 862CD-863CD). New York, USA: Cambridge University Press.

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 Creators:
van Aken, P. A.1, Author           
Koch, C. T.1, Author           
Sigle, W.1, Author           
Höschen, R.1, Author           
Rühle, M.2, Author           
Essers, E.3, Author
Benner, G.3, Author
Matijevic, M.3, Author
Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
2Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497650              
3Carl Zeiss SMT-NTS Division, Oberkochen, Germany, ou_persistent22              

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM); Emeriti and Others;
 Abstract: -

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Language(s): eng - English
 Dates: 2007
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 319189
 Degree: -

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Title: Microscopy and Microanalysis 2007
Place of Event: Fort Lauderdale, Florida, USA
Start-/End Date: 2007-08-05 - 2007-08-09

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Title: Microscopy and Microanalysis 2007
Source Genre: Proceedings
 Creator(s):
Marko, M., Editor
Scott, J.H., Editor
Vicenzi, E., Editor
Dekanich, S., Editor
Frafjord, J., Editor
Kotula, P., Editor
McKernan, V., Editor
Shields, J., Editor
Affiliations:
-
Publ. Info: New York, USA : Cambridge University Press
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 862CD - 863CD Identifier: -