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  Band-gap measurements of direct and indirect semiconductors using monochromated electrons

Gu, L., Srot, V., Sigle, W., Koch, C., van Aken, P. A., Scholz, F., et al. (2007). Band-gap measurements of direct and indirect semiconductors using monochromated electrons. Physical Review B, 75: 195214.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-43AF-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-43B0-0
Genre: Journal Article

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 Creators:
Gu, L.1, Author           
Srot, V.1, 2, Author           
Sigle, W.1, 2, Author           
Koch, C.1, 2, Author           
van Aken, P. A.1, Author           
Scholz, F.3, Author
Thapa, S. B.3, Author
Kirchner, C.3, Author
Jetter, M.3, Author
Rühle, M.4, Author           
Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
3Institute of Optoelectronics, University of Ulm, Ulm, Germany;Institut für Strahlenphysik, University of Stuttgart, Stuttgart, Germany, ou_persistent22              
4Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497650              

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM); Emeriti and Others;
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Language(s): eng - English
 Dates: 2007
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 319136
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Title: Physical Review B
Source Genre: Journal
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Pages: - Volume / Issue: 75 Sequence Number: 195214 Start / End Page: - Identifier: -