VEELS band gap measurements using monochromated electrons

Gu, L.; Srot, V.; Sigle, W.; Koch, C.; van Aken, P.

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VEELS band gap measurements using monochromated electrons

Gu, L., Srot, V., Sigle, W., Koch, C., & van Aken, P. (2008). VEELS band gap measurements using monochromated electrons. Journal of Physics: Conference Series, 126: 012005.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-415C-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-415D-F

Genre: Conference Paper

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Creators:
Gu, L.¹, Author
Srot, V.^{1, 2}, Author
Sigle, W.^{1, 2}, Author
Koch, C.^{1, 2}, Author
van Aken, P.¹, Author

Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM);

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Language(s): eng - English

Dates: Date issued: 2008

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 391536

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Title: Electron Microscopy and Analysis Group Conference 2007 (EMAG 2007)

Place of Event: Glasgow, UK

Start-/End Date: 2007-09-03 - 2007-09-07

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Title: Journal of Physics: Conference Series

Source Genre: Journal

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Pages: - Volume / Issue: 126 Sequence Number: 012005 Start / End Page: - Identifier: -