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  Quantitative image matching between experimental and simulated high-resolution transmission electron micrographs

Du, K., Phillipp, F., & Rühle, M. (2008). Quantitative image matching between experimental and simulated high-resolution transmission electron micrographs. Korean Journal of Microscopy, 38(4, Supplement), 514-515.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4158-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4159-8
Genre: Conference Paper

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 Creators:
Du, K., Author           
Phillipp, F.1, Author           
Rühle, M.2, Author           
Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497669              
2Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497650              

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM); Emeriti and Others;
 Abstract: -

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Language(s): eng - English
 Dates: 2008
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 391277
 Degree: -

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Title: The 9th Asia-Pacific Microscopy Conference (APMC9)
Place of Event: Jeju, South Korea
Start-/End Date: 2008-11-02 - 2008-11-07

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Title: Korean Journal of Microscopy
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 38 (4, Supplement) Sequence Number: - Start / End Page: 514 - 515 Identifier: -