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  Analytical and high-resolution TEM investigation of boron-doped CeO2

Rahmati, B., Gregori, G., Sigle, W., Koch, C. T., van Aken, P. A., & Maier, J. (2008). Analytical and high-resolution TEM investigation of boron-doped CeO2. In S. Richter, & A. Schwedt (Eds.), EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science (pp. 565-566). Berlin [et al.]: Springer.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4100-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4101-E
Genre: Conference Paper

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 Creators:
Rahmati, B.1, 2, Author           
Gregori, G.3, Author
Sigle, W.1, 2, Author           
Koch, C. T.1, 2, Author           
van Aken, P. A.2, Author           
Maier, J.3, Author
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
3Max Planck Society, ou_persistent13              

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Free keywords: MPI für Intelligente Systeme; MPI für Festkörperforschung; Stuttgart Center for Electron Microscopy (StEM); Maier;
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Language(s): eng - English
 Dates: 2008
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 376667
URI: 10.1007/978-3-540-85226-1_283
 Degree: -

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Title: 14th European Microscopy Congress
Place of Event: Aachen, Germany
Start-/End Date: 2008-09-01 - 2008-09-05

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Title: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science
Source Genre: Proceedings
 Creator(s):
Richter, S., Editor
Schwedt, A., Editor
Affiliations:
-
Publ. Info: Berlin [et al.] : Springer
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 565 - 566 Identifier: -