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  Analytical TEM investigations of Pt/YSZ interfaces

Srot, V., Watanabe, M., Scheu, C., van Aken, P. A., Mutoro, E., Janek, J., et al. (2008). Analytical TEM investigations of Pt/YSZ interfaces. In S. Richter, & A. Schwedt (Eds.), EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science (pp. 369-370). Berlin [et al.]: Springer.

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 Creators:
Srot, V.1, Author           
Watanabe, M., Author           
Scheu, C., Author           
van Aken, P. A.1, Author           
Mutoro, E.2, Author
Janek, J.2, Author
Rühle, M.3, Author           
Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
2National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA94720, USA;Department Physical Metallurgy and Materials Testing, University of Leoben, Franz-Josef-Straße 18, Leoben, Austria;Institute of Physical Chemistry, Justus-Liebig-University Gießen, Heinrich-Buff-Ring 58, Gießen, Germany, ou_persistent22              
3Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497650              

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Free keywords: MPI für Intelligente Systeme; Stuttgart Center for Electron Microscopy (StEM); Emeriti and Others;
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Language(s): eng - English
 Dates: 2008
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 376663
DOI: 10.1007/978-3-540-85226-1_185
 Degree: -

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Title: 14th European Microscopy Congress
Place of Event: Aachen, Germany
Start-/End Date: 2008-09-01 - 2008-09-05

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Title: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science
Source Genre: Proceedings
 Creator(s):
Richter, S., Editor
Schwedt, A., Editor
Affiliations:
-
Publ. Info: Berlin [et al.] : Springer
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 369 - 370 Identifier: -