Sub-0.5 eV EFTEM mapping using the Zeiss SESAM

Koch, C. T.; Sigle, W.; Nelayah, J.; Gu, L.; Srot, V.; van Aken, P. A.

doi:10.1007/978-3-540-85226-1_224

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Sub-0.5 eV EFTEM mapping using the Zeiss SESAM

Koch, C. T., Sigle, W., Nelayah, J., Gu, L., Srot, V., & van Aken, P. A. (2008). Sub-0.5 eV EFTEM mapping using the Zeiss SESAM. In M. Luysberg, K. Tillmann, & T. Weirich (Eds.), EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods (pp. 447-448). Berlin [et al.]: Springer.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-40F0-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-40F1-9

Genre: Conference Paper

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Creators:
Koch, C. T.^{1, 2}, Author
Sigle, W.^{1, 2}, Author
Nelayah, J.², Author
Gu, L.², Author
Srot, V.^{1, 2}, Author
van Aken, P. A.², Author

Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669

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Free keywords: MPI für Intelligente Systeme; Stuttgart Center for Electron Microscopy (StEM);

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Language(s): eng - English

Dates: Date issued: 2008

Publication Status: Issued

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Rev. Type: Internal

Identifiers: eDoc: 376641
DOI: 10.1007/978-3-540-85226-1_224

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Title: 14th European Microscopy Congress

Place of Event: Aachen, Germany

Start-/End Date: 2008-09-01 - 2008-09-05

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Title: EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods

Source Genre: Proceedings

Creator(s):
Luysberg, M., Editor
Tillmann, K., Editor
Weirich, T., Editor

Affiliations:
-

Publ. Info: Berlin [et al.] : Springer

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 447 - 448 Identifier: -