Investigation of metal-induced crystallization in amorphous Ge/crystalline Al 
bilayers by Auger microanalysis and selected-area depth profiling

Wang, Z. M.; Wang, J. Y.; Jeurgens, L. P. H.; Mittemeijer, E. J.

doi:10.1002/sia.2626

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Investigation of metal-induced crystallization in amorphous Ge/crystalline Al bilayers by Auger microanalysis and selected-area depth profiling

Wang, Z. M., Wang, J. Y., Jeurgens, L. P. H., & Mittemeijer, E. J. (2008). Investigation of metal-induced crystallization in amorphous Ge/crystalline Al bilayers by Auger microanalysis and selected-area depth profiling. Surface and Interface Analysis, 40, 427-437. doi:10.1002/sia.2626.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-40C1-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-40C2-2

Genre: Journal Article

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Creators:
Wang, Z. M.¹, Author
Wang, J. Y.¹, Author
Jeurgens, L. P. H.¹, Author
Mittemeijer, E. J.^{1, 2}, Author

Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;

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Language(s): eng - English

Dates: Date issued: 2008

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 372465
DOI: 10.1002/sia.2626

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Title: Surface and Interface Analysis

Source Genre: Journal

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Pages: - Volume / Issue: 40 Sequence Number: - Start / End Page: 427 - 437 Identifier: -