Image matching between experimental and simulated high-resolution electron 
micrographs of sapphire on the [0110] orientation

Du, K.; Rühle, M.

doi:10.1111/j.1365-2818.2008.02073.x

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Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the [0110] orientation

Du, K., & Rühle, M. (2008). Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the [0110] orientation. Journal of Microscopy, 232(1), 137-144. doi:10.1111/j.1365-2818.2008.02073.x.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3FB3-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3FB4-B

Genre: Journal Article

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Creators:
Du, K., Author
Rühle, M.¹, Author

Affiliations:
1Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497650

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Free keywords: MPI für Metallforschung; Emeriti and Others;

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Language(s): eng - English

Dates: Date issued: 2008-03-19

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 378641
DOI: 10.1111/j.1365-2818.2008.02073.x

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Title: Journal of Microscopy

Source Genre: Journal

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Pages: - Volume / Issue: 232 (1) Sequence Number: - Start / End Page: 137 - 144 Identifier: -