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  Determination of the elastic modulus of mesoporous silica thin films by x-ray reflectivity via the capillary condensation of water

Dourdain, S., Britton, D. T., Reichert, H., & Gibaud, A. (2008). Determination of the elastic modulus of mesoporous silica thin films by x-ray reflectivity via the capillary condensation of water. Applied Physics Letters, 93: 183108. doi:10.1063/1.2996412.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3EF4-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3EF5-0
Genre: Journal Article
Alternative Title : Appl. Phys. Lett.

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 Creators:
Dourdain, S.1, Author
Britton, D. T.1, Author
Reichert, H.2, Author           
Gibaud, A.1, Author
Affiliations:
1Structure et Propriété des Architectures Moléculaires, UMR 5819, CEA Grenobe, France; University of Cape Town, Private Bag Rondebosch 7701, South Africa; Laboratoire de Physique de l'Etat Condensé, UMR CNRS 6087, Université du Maine, 72085 Le Mans, France, ou_persistent22              
2Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645              

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Free keywords: MPI für Metallforschung; Abt. Dosch;
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Language(s): eng - English
 Dates: 2008-11-04
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 391596
DOI: 10.1063/1.2996412
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Title: Applied Physics Letters
  Alternative Title : Appl. Phys. Lett.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 93 Sequence Number: 183108 Start / End Page: - Identifier: -