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  EELS of niobium and stoichiometric niobium-oxide phases — part I: Plasmon and near-edges fine structure

Bach, D., Schneider, R., Gerthsen, D., Verbeeck, J., & Sigle, W. (2009). EELS of niobium and stoichiometric niobium-oxide phases — part I: Plasmon and near-edges fine structure. Microscopy and Microanalysis, 15, 505-523. doi:10.1017/S143192760999105X.

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Genre: Journal Article
Alternative Title : Microsc. Microanal.

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 Creators:
Bach, D.1, Author
Schneider, R.1, Author
Gerthsen, D.1, Author
Verbeeck, J.1, Author
Sigle, W.2, 3, Author           
Affiliations:
1Laboratorium für Elektronenmikroskopie, Universität Karlsruhe (TH), D-76128 Karlsruhe, Germany; Electron Microscopy for Materials Research (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium., ou_persistent22              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM);
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Language(s): eng - English
 Dates: 2009
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 442627
DOI: 10.1017/S143192760999105X
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Title: Microscopy and Microanalysis
  Alternative Title : Microsc. Microanal.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 15 Sequence Number: - Start / End Page: 505 - 523 Identifier: -