Surface and grain-boundary segregation studied by quantitative AES and XPS

Hofmann, S.; Lejcek, P.

doi:10.3139/146.110162

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Surface and grain-boundary segregation studied by quantitative AES and XPS

Hofmann, S., & Lejcek, P. (2009). Surface and grain-boundary segregation studied by quantitative AES and XPS. International Journal of Materials Research, 100, 1167-1172. doi:10.3139/146.110162.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3E44-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3E45-B

Genre: Journal Article

Alternative Title : IJMR

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Creators:
Hofmann, S.¹, Author
Lejcek, P.², Author

Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644
2Institute of Physics, ASCR, Na Slovance 2, CZ-182 21 Praha 8, Czech Republic, ou_persistent22

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Free keywords: MPI für Metallforschung; Emeriti and Others;

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Language(s): eng - English

Dates: Date issued: 2009

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 438302
DOI: 10.3139/146.110162

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Title: International Journal of Materials Research

Alternative Title : IJMR

Source Genre: Journal

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Pages: - Volume / Issue: 100 Sequence Number: - Start / End Page: 1167 - 1172 Identifier: -