Mapping of valence energy losses via energy-filtered annular dark-field 
scanning transmission electron microscopy

Gu, L.; Sigle, W.; Koch, C. T.; Nelayah, J.; Srot, V.; van Aken, P. A.

doi:10.1016/j.ultramic.2009.05.001

Local TagsRelease HistoryDetailsSummary

Mapping of valence energy losses via energy-filtered annular dark-field scanning transmission electron microscopy

Gu, L., Sigle, W., Koch, C. T., Nelayah, J., Srot, V., & van Aken, P. A. (2009). Mapping of valence energy losses via energy-filtered annular dark-field scanning transmission electron microscopy. Ultramicroscopy, 109, 1164-1170. doi:10.1016/j.ultramic.2009.05.001.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3E34-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3E35-F

Genre: Journal Article

Files

show Files

Locators

show

Creators

show

hide

Creators:
Gu, L.¹, Author
Sigle, W.^{1, 2}, Author
Koch, C. T.^{1, 2}, Author
Nelayah, J.¹, Author
Srot, V.^{1, 2}, Author
van Aken, P. A.¹, Author

Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657

Content

show

hide

Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM);

Abstract: -

Details

show

hide

Language(s): eng - English

Dates: Date issued: 2009

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: Peer

Identifiers: eDoc: 437025
DOI: 10.1016/j.ultramic.2009.05.001

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Ultramicroscopy

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: -

Pages: - Volume / Issue: 109 Sequence Number: - Start / End Page: 1164 - 1170 Identifier: -