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  Strain measurements on Si/SiGe heterostructures using HRTEM

Özdöl, V. B., Koch, C. T., Phillipp, F., & van Aken, P. A. (2009). Strain measurements on Si/SiGe heterostructures using HRTEM. In W. Grogger, F. Hofer, & P. Pölt (Eds.), MC2009. Vol. 3: Materials Science (pp. 447-448). Graz: Verlag der Technischen Universität Graz, Austria.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3E1F-3 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3E20-E
Genre: Conference Paper

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 Creators:
Özdöl, V. B.1, Author           
Koch, C. T.1, Author           
Phillipp, F.1, Author           
van Aken, P. A.1, Author           
Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

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Free keywords: MPI für Intelligente Systeme; Stuttgart Center for Electron Microscopy (StEM);
 Abstract: -

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Language(s): eng - English
 Dates: 2009
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 435834
DOI: 10.3217/978-3-85125-062-6-596
 Degree: -

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Title: MC2009, Microscopy Conference
Place of Event: Graz, Austria
Start-/End Date: 2009-08-30 - 2009-09-04

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Title: MC2009. Vol. 3: Materials Science
Source Genre: Proceedings
 Creator(s):
Grogger, W., Editor
Hofer, F., Editor
Pölt, P., Editor
Affiliations:
-
Publ. Info: Graz : Verlag der Technischen Universität Graz, Austria
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 447 - 448 Identifier: -