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  Grain-boundary types in chalcopyrite-type thin films and their correlations with film texture and electrical properties

Abou-Ras, D., Koch, C. T., Küstner, V., van Aken, P. A., Jahn, U., Contreras, M. A., et al. (2009). Grain-boundary types in chalcopyrite-type thin films and their correlations with film texture and electrical properties. Thin Solid Films, 517, 2545-2549. doi:10.1016/j.tsf.2008.11.044.

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 Creators:
Abou-Ras, D.1, Author
Koch, C. T.2, 3, Author           
Küstner, V.3, 4, Author           
van Aken, P. A.3, Author           
Jahn, U.1, Author
Contreras, M. A.1, Author
Caballero, R.1, Author
Kaufmann, C. A.1, Author
Scheer, R.1, Author
Unold, T.1, Author
Schock, H.-W.1, Author
Affiliations:
1Hahn-Meitner-Institut Berlin, Glienicker Strasse 100, 14109 Berlin, Germany; Paul-Drude-Institut für Festkörperelektronik, Hausvogteiplatz 5-7, 10117 Berlin, Germany; National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, CO 80401, U.S.A., ou_persistent22              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
4Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM);
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Language(s): eng - English
 Dates: 2009
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 400486
DOI: 10.1016/j.tsf.2008.11.044
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Title: Thin Solid Films
Source Genre: Journal
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Pages: - Volume / Issue: 517 Sequence Number: - Start / End Page: 2545 - 2549 Identifier: -