Titanium–silicon oxide film structures for polarization-modulated infrared 
reflection absorption spectroscopy

Dunlop, I. E.; Zorn, S.; Richter, G.; Srot, V.; Kelsch, M.; van Aken, P. A.; Skoda, M.; Gerlach, A.; Spatz, J. P.; Schreiber, F.

doi:10.1016/j.tsf.2008.10.058

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Titanium–silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy

Dunlop, I. E., Zorn, S., Richter, G., Srot, V., Kelsch, M., van Aken, P. A., et al. (2009). Titanium–silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy. Thin Solid Films, 517, 2048-2054. doi:10.1016/j.tsf.2008.10.058.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3D50-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3D51-8

Genre: Journal Article

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Creators:
Dunlop, I. E.¹, Author
Zorn, S.², Author
Richter, G.^{3, 4}, Author
Srot, V.^{3, 5}, Author
Kelsch, M.^{3, 5}, Author
van Aken, P. A.⁵, Author
Skoda, M.², Author
Gerlach, A.², Author
Spatz, J. P.¹, Author
Schreiber, F.⁶, Author

Affiliations:
1Dept. New Materials and Biosystems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497649
2Institute for Applied Physics, Eberhard-Karls University of Tübingen, Auf der Morgenstelle 10, 72076 Tübingen, Germany;Physical and Theoretical Chemistry Laboratory, Oxford University, Oxford OX1 3QZ, United Kingdom;Department of Biophysical Chemistry, University of Heidelberg, INF 253, 69120 Heidelberg, Germany, ou_persistent22
3Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
4Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640
5Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669
6Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644

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Free keywords: MPI für Metallforschung; Abt. Spatz; Stuttgart Center for Electron Microscopy (StEM); Abt. Arzt; ZWE Dünnschichtlabor;

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Language(s): eng - English

Dates: Date issued: 2009

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 397148
DOI: 10.1016/j.tsf.2008.10.058

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Title: Thin Solid Films

Source Genre: Journal

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Pages: - Volume / Issue: 517 Sequence Number: - Start / End Page: 2048 - 2054 Identifier: -