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  Depth-dependent critical behavior in V2H

Del Genio, C. I., Trenkler, J., Bassler, K. E., Wochner, P., Haeffner, D. R., Reiter, G. F., et al. (2009). Depth-dependent critical behavior in V2H. Physical Review B, 79: 184113. doi:10.1103/PhysRevB.79.184113.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3CDD-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3CDE-3
Genre: Journal Article
Alternative Title : PRB

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 Creators:
Del Genio, C. I.1, Author
Trenkler, J.2, Author           
Bassler, K. E.1, Author
Wochner, P.2, Author           
Haeffner, D. R.1, Author
Reiter, G. F.1, Author
Bai, J.1, Author
Moss, S. C.1, Author
Affiliations:
1Department of Physics, University of Houston, 617 Science and Research 1, 4800 Calhoun Road, Houston, Texas 77204-5005, USA; Texas Center for Superconductivity, Houston, Texas 77204, USA; Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439-4815, USA; 5Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA, ou_persistent22              
2Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645              

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Free keywords: MPI für Intelligente Systeme; Abt. Dosch/Rühle;
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Language(s): eng - English
 Dates: 2009-05-29
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 430504
DOI: 10.1103/PhysRevB.79.184113
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Title: Physical Review B
  Alternative Title : PRB
Source Genre: Journal
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Pages: - Volume / Issue: 79 Sequence Number: 184113 Start / End Page: - Identifier: -