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  Microstructural and residual stress development in thin films

Regniet, D. (2009). Microstructural and residual stress development in thin films. Diploma Thesis, Universität Stuttgart, Stuttgart.

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 Creators:
Regniet, D.1, Author           
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;
 Abstract: -

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Language(s): eng - English
 Dates: 2009-11-12
 Publication Status: Accepted / In Press
 Pages: -
 Publishing info: Stuttgart : Universität Stuttgart
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 439698
 Degree: Diploma

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