English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
 Local TagsRelease HistoryDetailsSummary
  Quantitative analysis of crystal defects: towards 3-dimensional imaging of charge densities and atomic structure by inline electron holography

Koch, C. T. (2010). Quantitative analysis of crystal defects: towards 3-dimensional imaging of charge densities and atomic structure by inline electron holography. Microscopy and Microanalysis, 16(Suppl. 2), 1478-1479.

Item is

 

show all hide all

Basic

show hide
Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3C1B-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3C1C-6
Genre: Conference Paper
Alternative Title : Microsc. Microanal.

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Koch, C. T.1, 2, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

Content

show
hide
Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM);
 Abstract: -

Details

show
hide
Language(s): eng - English
 Dates: 2010
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 493463
DOI: 10.1017/S1431927610057089
 Degree: -

Event

show
hide
Title: Microscopy and Microanalysis 2010
Place of Event: Portland, Oregon, USA
Start-/End Date: 2010-08-01 - 2010-08-05

Legal Case

show

Project information

show

Source 1

show
hide
Title: Microscopy and Microanalysis
  Alternative Title : Microsc. Microanal.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 16 (Suppl. 2) Sequence Number: - Start / End Page: 1478 - 1479 Identifier: -