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  Low-loss EFTEM imaging of surface plasmon resonances in Ag nanostructures

van Aken, P. A., Sigle, W., Koch, C. T., Ögüt, B., Nelayah, J., & Gu, L. (2010). Low-loss EFTEM imaging of surface plasmon resonances in Ag nanostructures. Microscopy and Microanalysis, 16(Suppl. 2), 1438-1439.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3C19-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3C1A-A
Genre: Conference Paper
Alternative Title : Microsc. Microanal.

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 Creators:
van Aken, P. A.1, Author           
Sigle, W.1, 2, Author           
Koch, C. T.1, 2, Author           
Ögüt, B.1, Author           
Nelayah, J.1, Author           
Gu, L.1, Author           
Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM);
 Abstract: -

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Language(s): eng - English
 Dates: 2010
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 493462
DOI: 10.1017/S1431927610056242
 Degree: -

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Title: Microscopy and Microanalysis 2010
Place of Event: Portland, Oregon, USA
Start-/End Date: 2010-08-01 - 2010-08-05

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Title: Microscopy and Microanalysis
  Alternative Title : Microsc. Microanal.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 16 (Suppl. 2) Sequence Number: - Start / End Page: 1438 - 1439 Identifier: -