Off-axis and in line electron holography: experimental comparison

Latychevskaia, T.; Formanek, P.; Koch, C. T.; Lubk, A.

doi:10.1016/j.ultramic.2009.12.007

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Off-axis and in line electron holography: experimental comparison

Latychevskaia, T., Formanek, P., Koch, C. T., & Lubk, A. (2010). Off-axis and in line electron holography: experimental comparison. Ultramicroscopy, 110, 472-482. doi:10.1016/j.ultramic.2009.12.007.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3BB8-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3BB9-E

Genre: Journal Article

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Latychevskaia, T.¹, Author
Formanek, P.¹, Author
Koch, C. T.^{2, 3}, Author
Lubk, A.¹, Author

Affiliations:
1Institute of Physics, University of Zurich, Winterthurerstrasse190, 8057Zurich, Switzerland; Technische Universität Dresden,Triebenberg Lab,Zum Triebenberg 50,01328Dresden, Germany., ou_persistent22
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM);

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Language(s): eng - English

Dates: Date issued: 2010

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 478116
DOI: 10.1016/j.ultramic.2009.12.007

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Title: Ultramicroscopy

Source Genre: Journal

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Pages: - Volume / Issue: 110 Sequence Number: - Start / End Page: 472 - 482 Identifier: -