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  Distribution of ions near a charged selective surface in critical binary solvents

Ciach, A., & Maciolek, A. (2010). Distribution of ions near a charged selective surface in critical binary solvents. Physical Review E, 81(4): 041127. doi:10.1103/PhysRevE.81.041127.

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Genre: Journal Article
Alternative Title : Phys. Rev. E

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 Creators:
Ciach, A.1, Author
Maciolek, A.2, Author           
Affiliations:
1Institute of Physical Chemistry, Polish Academy of Sciences, Kasprzaka 44/52, PL-01-224 Warsaw, Poland; Institut für Theoretische und Angewandte Physik, Universität Stuttgart, Pfaffenwaldring 57, D-70569 Stuttgart, Germany, ou_persistent22              
2Dept. Theory of Inhomogeneous Condensed Matter, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497643              

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Free keywords: MPI für Metallforschung; Abt. Dietrich; Critical Phenomena;
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Language(s): eng - English
 Dates: 2010-04-22
 Publication Status: Issued
 Pages: 11 pages
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 476842
DOI: 10.1103/PhysRevE.81.041127
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Title: Physical Review E
  Alternative Title : Phys. Rev. E
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 81 (4) Sequence Number: 041127 Start / End Page: - Identifier: -