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  Interface science - knowing more about less.

Rühle, M., Gemming, T., Kienzle, O., & Schweinfest, R. (1999). Interface science - knowing more about less. In Electron Microscopy and Analysing 1999 (pp. 1-8). Bristol: Institute of Physics Publishing.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3A27-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3A28-B
Genre: Book Chapter

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 Creators:
Kiely, C. J., Editor
Rühle, M.1, Author           
Gemming, T.1, Author           
Kienzle, O.1, Author           
Schweinfest, R.1, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              

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Free keywords: MPI für Metallforschung; Abt. Rühle;
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Language(s): eng - English
 Dates: 1999
 Publication Status: Issued
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 Rev. Type: -
 Identifiers: eDoc: 198717
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Title: Electron Microscopy and Analysing 1999
Source Genre: Book
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Publ. Info: Bristol : Institute of Physics Publishing
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 1 - 8 Identifier: -

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Title: Institute of Physics Conference Series
Source Genre: Series
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Pages: - Volume / Issue: 161 Sequence Number: - Start / End Page: - Identifier: -