Strain profiles in epitaxial films from X-ray Bragg diffraction phases

Vartanyants, I.; Ern, C.; Donner, W.; Dosch, H.; Caliebe, W.

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Strain profiles in epitaxial films from X-ray Bragg diffraction phases

Vartanyants, I., Ern, C., Donner, W., Dosch, H., & Caliebe, W. (2000). Strain profiles in epitaxial films from X-ray Bragg diffraction phases. Applied Physics Letters, 77, 3929-3931.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3995-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3996-A

Genre: Journal Article

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Creators:
Vartanyants, I., Author
Ern, C.¹, Author
Donner, W.¹, Author
Dosch, H.^{1, 2}, Author
Caliebe, W., Author

Affiliations:
1Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645
2Universität Stuttgart, Institut für Theoretische und Angewandte Physik, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Dosch;

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Language(s): eng - English

Dates: Date issued: 2000

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 200793

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Title: Applied Physics Letters

Source Genre: Journal

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Pages: - Volume / Issue: 77 Sequence Number: - Start / End Page: 3929 - 3931 Identifier: -