New methods for diffraction stress measurement: A critical evaluation of new 
and existing methods

Kamminga, J.-D.; de Keijser, T. H.; Mittemeijer, E. J.; Delhez, R.

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New methods for diffraction stress measurement: A critical evaluation of new and existing methods

Kamminga, J.-D., de Keijser, T. H., Mittemeijer, E. J., & Delhez, R. (2000). New methods for diffraction stress measurement: A critical evaluation of new and existing methods. Journal of Applied Crystallography, 33, 1059-1066.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3935-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3936-4

Genre: Journal Article

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Creators:
Kamminga, J.-D., Author
de Keijser, T. H., Author
Mittemeijer, E. J.^{1, 2}, Author
Delhez, R., Author

Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;

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Language(s): eng - English

Dates: Date issued: 2000

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 200636

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Title: Journal of Applied Crystallography

Source Genre: Journal

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Pages: - Volume / Issue: 33 Sequence Number: - Start / End Page: 1059 - 1066 Identifier: -