X-Ray diffraction analysis of stacking and twin faults in fcc metals: A 
revision and allowance for texture and non-uniform fault probabilities

Velterop, L.; Delhez, R.; de Keijser, T. H.; Mittemeijer, E. J.; Reefmann, D.

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X-Ray diffraction analysis of stacking and twin faults in fcc metals: A revision and allowance for texture and non-uniform fault probabilities

Velterop, L., Delhez, R., de Keijser, T. H., Mittemeijer, E. J., & Reefmann, D. (2000). X-Ray diffraction analysis of stacking and twin faults in fcc metals: A revision and allowance for texture and non-uniform fault probabilities. Journal of Applied Physics, 33, 296-306.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3925-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3926-8

Genre: Journal Article

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Creators:
Velterop, L., Author
Delhez, R., Author
de Keijser, T. H., Author
Mittemeijer, E. J.^{1, 2}, Author
Reefmann, D., Author

Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;

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Language(s): eng - English

Dates: Date issued: 2000

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 200619

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Title: Journal of Applied Physics

Source Genre: Journal

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Pages: - Volume / Issue: 33 Sequence Number: - Start / End Page: 296 - 306 Identifier: -