Self-diffusion studies on 15N in amorphous Si3BC4.3N2 ceramics with ion 
implantation and secondary ion mass spectrometry

Schmidt, H.; Borchardt, G.; Weber, S.; Scherrer, S.; Baumann, H.; Müller, A.; Bill, J.

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Self-diffusion studies on ¹⁵N in amorphous Si₃BC_4.3N₂ ceramics with ion implantation and secondary ion mass spectrometry

Schmidt, H., Borchardt, G., Weber, S., Scherrer, S., Baumann, H., Müller, A., et al. (2000). Self-diffusion studies on ¹⁵N in amorphous Si₃BC_4.3N₂ ceramics with ion implantation and secondary ion mass spectrometry. Journal of Applied Physics, 88, 1827-1830.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-38B0-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-38B1-3

Genre: Journal Article

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Creators:
Schmidt, H., Author
Borchardt, G., Author
Weber, S., Author
Scherrer, S., Author
Baumann, H., Author
Müller, A.¹, Author
Bill, J.², Author

Affiliations:
1Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497654
2Universität Stuttgart, Institut für Nichtmetallische Anorganische Materialien, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Aldinger;

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Language(s): eng - English

Dates: Date issued: 2000

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 198989

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Title: Journal of Applied Physics

Source Genre: Journal

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Pages: - Volume / Issue: 88 Sequence Number: - Start / End Page: 1827 - 1830 Identifier: -