An X-ray reflectivity study of solution-deposited ZrO2 thin films on SAMs: 
growth, interface properties, and thermal densification

Ritley, K. A.; Just, K.-P.; Schreiber, F.; Dosch, H.; Niesen, T. P.; Aldinger, F.

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An X-ray reflectivity study of solution-deposited ZrO₂ thin films on SAMs: growth, interface properties, and thermal densification

Ritley, K. A., Just, K.-P., Schreiber, F., Dosch, H., Niesen, T. P., & Aldinger, F. (2000). An X-ray reflectivity study of solution-deposited ZrO₂ thin films on SAMs: growth, interface properties, and thermal densification. Journal of Materials Research, 15, 2706-2713.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-38AC-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-38AD-F

Genre: Journal Article

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Creators:
Ritley, K. A.¹, Author
Just, K.-P.¹, Author
Schreiber, F.², Author
Dosch, H.^{1, 3}, Author
Niesen, T. P.⁴, Author
Aldinger, F.^{4, 5}, Author

Affiliations:
1Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645
2Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644
3Universität Stuttgart, Institut für Theoretische und Angewandte Physik, ou_persistent22
4Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497654
5Universität Stuttgart, Institut für Nichtmetallische Anorganische Materialien, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Aldinger; Abt. Dosch;

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Language(s): eng - English

Dates: Date issued: 2000

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 198986

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Title: Journal of Materials Research

Source Genre: Journal

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Pages: - Volume / Issue: 15 Sequence Number: - Start / End Page: 2706 - 2713 Identifier: -