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  Selective specimen preparation for TEM observation of the cross-section of individual carbon nanotube/metal junctions

Wei, B.-Q., Kohler-Redlich, P., Bäder, U., Heiland, B., Spolenak, R., Arzt, E., et al. (2000). Selective specimen preparation for TEM observation of the cross-section of individual carbon nanotube/metal junctions. Ultramicroscopy, 85, 93-98.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-385E-3 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-385F-1
Genre: Journal Article

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 Creators:
Wei, B.-Q., Author
Kohler-Redlich, P.1, Author           
Bäder, U.1, Author           
Heiland, B.2, Author           
Spolenak, R.2, Author           
Arzt, E.2, 3, Author           
Rühle, M.1, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
3Universität Stuttgart, Institut für Metallkunde, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Rühle; Abt. Arzt;
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Language(s): fra - French
 Dates: 2000
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 198921
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Title: Ultramicroscopy
Source Genre: Journal
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Pages: - Volume / Issue: 85 Sequence Number: - Start / End Page: 93 - 98 Identifier: -