Atomic structure and bonding of epitaxial Cu films on (110) a-Al2O3.

Scheu, C.; Stein, W.; Schweinfest, R.; Wagner, T.; Rühle, M.

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Atomic structure and bonding of epitaxial Cu films on (110) a-Al₂O₃.

Scheu, C., Stein, W., Schweinfest, R., Wagner, T., & Rühle, M. (2000). Atomic structure and bonding of epitaxial Cu films on (110) a-Al₂O₃. In G. Bailey (Ed.), Proceedings Microscopy and Microanalysis 2000 (pp. 182-183). New York: Springer.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3840-3 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3841-1

Genre: Conference Paper

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Creators:
Scheu, C.¹, Author
Stein, W.¹, Author
Schweinfest, R.¹, Author
Wagner, T.², Author
Rühle, M.¹, Author

Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
2Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640

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Free keywords: MPI für Metallforschung; Ehemalige Abt. Rühle; Abt. Arzt; ZWE Dünnschichtlabor;

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Language(s): eng - English

Dates: Date issued: 2000

Publication Status: Issued

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Identifiers: eDoc: 198894

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Title: Microscopy and Microanalysis 2000

Place of Event: Philadelphia, Pa.

Start-/End Date: 2000-08-17 - 2000-08-20

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Title: Proceedings Microscopy and Microanalysis 2000

Source Genre: Proceedings

Creator(s):
Bailey, G.W., Editor

Affiliations:
-

Publ. Info: New York : Springer

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 182 - 183 Identifier: -