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  A combined approach of analytical and high-resolution TEM to determine the interface structure of Cu/(1120) α-Al2O3.

Scheu, C., Stein, W., Schweinfest, R., Wagner, T., & Rühle, M. (2000). A combined approach of analytical and high-resolution TEM to determine the interface structure of Cu/(1120) α-Al2O3. In J. Gemperlova, & I. Vavra (Eds.), Proceedings of the 12th European Congress on Electron Microscopy, Vol. 2: Physical Sciences (pp. 413-414). Czechoslovak Society for Electron Microscopy.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-383E-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-383F-9
Genre: Conference Paper

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 Creators:
Scheu, C.1, Author           
Stein, W.1, Author           
Schweinfest, R.1, Author           
Wagner, T.2, Author           
Rühle, M.1, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640              

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Free keywords: MPI für Metallforschung; Abt. Rühle; Abt. Arzt; ZWE Dünnschichtlabor;
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Language(s): eng - English
 Dates: 2000
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 198891
Other: 29371
 Degree: -

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Title: 12th European Congress on Electron Microscopy
Place of Event: Brno/Czech Republic
Start-/End Date: 2000-07-09 - 2000-07-14

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Title: Proceedings of the 12th European Congress on Electron Microscopy, Vol. 2: Physical Sciences
Source Genre: Proceedings
 Creator(s):
Gemperlova, J., Editor
Vavra, I., Editor
Affiliations:
-
Publ. Info: Czechoslovak Society for Electron Microscopy
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 413 - 414 Identifier: -