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  Advanced instrumentations for interface studies by electron energy-loss spectroscopy (EELS, ELNES and ESI)?

Rühle, M., Elsässer, C., Scheu, C., & Sigle, W. (2000). Advanced instrumentations for interface studies by electron energy-loss spectroscopy (EELS, ELNES and ESI)? In G. Bailey (Ed.), Microscopy and Microanalysis 2000 (pp. 188-189). New York: Springer.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-383A-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-383B-2
Genre: Conference Paper

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 Creators:
Rühle, M.1, Author           
Elsässer, C.1, Author           
Scheu, C.1, Author           
Sigle, W.1, 2, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

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Free keywords: MPI für Metallforschung; Abt. Rühle;
 Abstract: -

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Language(s): eng - English
 Dates: 2000
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 198883
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Title: Microscopy and Microanalysis 2000
Place of Event: Philadelphia, Pa.
Start-/End Date: 2000-08-13 - 2000-08-17

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Title: Microscopy and Microanalysis 2000
Source Genre: Proceedings
 Creator(s):
Bailey, G.W., Editor
Affiliations:
-
Publ. Info: New York : Springer
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 188 - 189 Identifier: -

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Title: Microscopy and Microanalysis
Source Genre: Series
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Publ. Info: -
Pages: - Volume / Issue: 6, Suppl. 2 Sequence Number: - Start / End Page: - Identifier: -