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  Growth and characterization of nanostructured β-SiC via carbothermal reduction of SiO2 xerogels containing carbon nanoparticles

Meng, G. W., Cui, Z., Zhang, L. D., & Phillipp, F. (2000). Growth and characterization of nanostructured β-SiC via carbothermal reduction of SiO2 xerogels containing carbon nanoparticles. Journal of Crystal Growth, 209, 801-806.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3826-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3828-C
Genre: Journal Article

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 Creators:
Meng, G. W.1, Author
Cui, Z.1, Author
Zhang, L. D.1, Author
Phillipp, F.2, Author           
Affiliations:
1Laboratory of Internal Friction, Institute of Solid State Physics, Chinese Academy of Sciences, Hefei, PRChinaInstitute of Advanced Studies, University of Science and Technology of China, Hefei, PRChina, ou_persistent22              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497657              

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Free keywords: MPI für Metallforschung; Abt. Rühle; ZWE Hochspannungs-Mikroskopie;
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Language(s): eng - English
 Dates: 2000
 Publication Status: Issued
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 Rev. Type: Peer
 Identifiers: eDoc: 198871
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Title: Journal of Crystal Growth
Source Genre: Journal
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Pages: - Volume / Issue: 209 Sequence Number: - Start / End Page: 801 - 806 Identifier: -