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  Influence of experimental parameters on the accuracy of lattice-distortion measurements directly from high-resolution micrographs

Du, K., Jin-Phillipp, N. Y., & Phillipp, F. (2000). Influence of experimental parameters on the accuracy of lattice-distortion measurements directly from high-resolution micrographs. In P. Ciampor, L. Frank, P. Tomanek, & R. Kolarik (Eds.), Proceedings of the 12th European Congress on Electron Microscopy. Vol. 3 (pp. 137-138). Brno: Czechoslovak Society for Electron Microscopy.

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 Creators:
Du, K.1, Author           
Jin-Phillipp, N. Y.1, Author           
Phillipp, F.1, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              

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Free keywords: MPI für Metallforschung; Abt. Rühle; ZWE Hochspannungs-Mikroskopie;
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Language(s): eng - English
 Dates: 2000
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 43732
 Degree: -

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Title: 12th European Congress on Electron Microscopy (EUREM2000)
Place of Event: Brno [Czech Republic]
Start-/End Date: 2000-07-09 - 2000-07-14

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Title: Proceedings of the 12th European Congress on Electron Microscopy. Vol. 3
Source Genre: Proceedings
 Creator(s):
Ciampor, P., Editor
Frank, L., Editor
Tomanek, P., Editor
Kolarik, R., Editor
Affiliations:
-
Publ. Info: Brno : Czechoslovak Society for Electron Microscopy
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 137 - 138 Identifier: -