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  Energy dissipation and path instabilities in dynamic fracture of silicon single crystals

Cramer, T., Wanner, A., & Gumbsch, P. (2000). Energy dissipation and path instabilities in dynamic fracture of silicon single crystals. Physical Review Letters, 85, 788-791.

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 Creators:
Cramer, T.1, Author           
Wanner, A.1, Author           
Gumbsch, P.1, Author           
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              

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Free keywords: MPI für Metallforschung; Abt. Arzt;
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Language(s): eng - English
 Dates: 2000
 Publication Status: Issued
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 Rev. Type: Peer
 Identifiers: eDoc: 43713
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Title: Physical Review Letters
Source Genre: Journal
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Pages: - Volume / Issue: 85 Sequence Number: - Start / End Page: 788 - 791 Identifier: -