Diffraction-line broadening analysis of dislocation configurations

Vermeulen, A.C.; Delhez, R.; Keijser, Th.H. de; Mittemeijer, E.J.

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Diffraction-line broadening analysis of dislocation configurations

Vermeulen, A., Delhez, R., Keijser, T. d., & Mittemeijer, E. (2000). Diffraction-line broadening analysis of dislocation configurations. In R. Snyder, J. Fiala, & H. Bunge (Eds.), Defect and Microstructure Analysis by Diffraction (pp. 200-213). Oxford: Oxford University Press.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-374A-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-374B-6

Genre: Book Chapter

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Creators:
Vermeulen, A.C., Author
Delhez, R., Author
Keijser, Th.H. de, Author
Mittemeijer, E.J.^{1, 2}, Author

Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;

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Language(s): eng - English

Dates: Date issued: 2000-01-06

Publication Status: Issued

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Identifiers: eDoc: 220908

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Title: Defect and Microstructure Analysis by Diffraction

Source Genre: Book

Creator(s):
Snyder, R.L., Editor
Fiala, J., Editor
Bunge, H.J., Editor

Affiliations:
-

Publ. Info: Oxford : Oxford University Press

Pages: 808 Volume / Issue: - Sequence Number: - Start / End Page: 200 - 213 Identifier: -