The preparation of TEM-specimens using Focused Ion Beam (FIB)

Spolenak, R.; Heiland, B.; Witt, C.; Keller, R. M.; Müllner, P.; Arzt, E.

Local TagsRelease HistoryDetailsSummary

The preparation of TEM-specimens using Focused Ion Beam (FIB)

Spolenak, R., Heiland, B., Witt, C., Keller, R. M., Müllner, P., & Arzt, E. (2000). The preparation of TEM-specimens using Focused Ion Beam (FIB). Praktische Metallographie - Practical Metallography, 37(2), 90-101.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3742-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3743-5

Genre: Journal Article

Files

show Files

Locators

show

Creators

show

hide

Creators:
Spolenak, R.¹, Author
Heiland, B.¹, Author
Witt, C.¹, Author
Keller, R. M., Author
Müllner, P.¹, Author
Arzt, E.^{1, 2}, Author

Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655
2Universität Stuttgart, Institut für Metallkunde, ou_persistent22

Content

show

hide

Free keywords: MPI für Metallforschung; Abt. Arzt;

Abstract: -

Details

show

hide

Language(s): eng - English

Dates: Date issued: 2000-02

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 204331

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Praktische Metallographie - Practical Metallography

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: -

Pages: - Volume / Issue: 37 (2) Sequence Number: - Start / End Page: 90 - 101 Identifier: -