Depth Profiling

Hofmann, S.

Local TagsRelease HistoryDetailsSummary

Depth Profiling

Hofmann, S. (2001). Depth Profiling. In K. J. Buschow, R. Cahn, M. Flemings, B. Ilschner, E. Kramer, & S. Mahajan (Eds.), Encyclopedia of Materials: Science and Technology (pp. 2078-2089). Amsterdam, The Netherlands: Elsevier.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-36A3-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-36A4-4

Genre: Book Chapter

Files

show Files

Locators

show

Creators

show

hide

Creators:
Hofmann, S.¹, Author

Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644

Content

show

hide

Free keywords: MPI für Metallforschung; Abt. Mittemeijer;

Abstract: -

Details

show

hide

Language(s): eng - English

Dates: Date issued: 2001

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 35128

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Encyclopedia of Materials: Science and Technology

Source Genre: Book

Creator(s):
Buschow, K.H. J., Editor
Cahn, R.W., Editor
Flemings, M.C., Editor
Ilschner, B., Editor
Kramer, E.J., Editor
Mahajan, S., Editor

Affiliations:
-

Publ. Info: Amsterdam, The Netherlands : Elsevier

Pages: - Volume / Issue: 3 Sequence Number: - Start / End Page: 2078 - 2089 Identifier: -